Optimal design of step-stress accelerated degradation tests based on the Tweedie exponential dispersion process

In this paper, we are interested in the optimization of step-stress accelerated degradation test plan when path follows Tweedie exponential dispersion process which has been shown to be an important family analysis. We firstly prove that, under model with a drift parameter being function (transformed) stress level, multi-level will correspond simple using only minimum and maximum levels D-optimality V-optimality criteria. The optimum based on these two optimality criteria is subsequently derived, numerical example furthermore presented compare efficiency proposed plans some by previous study. addition, simulation study conducted for investigating performances plans.